Gaya APA
Matters-Kammerer, Marion K., Jinesh, K. B., Rijks, Theo G. S. M., Roozeboom, Fred, Klootwijk, Johan H.. ().
Characterization and modeling of atomic layer deposited high-density trench capacitors in silicon .
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Gaya Chicago
Matters-Kammerer, Marion K., Jinesh, K. B., Rijks, Theo G. S. M., Roozeboom, Fred, Klootwijk, Johan H..
Characterization and modeling of atomic layer deposited high-density trench capacitors in silicon.
:
,
.
Text.
Gaya MLA
Matters-Kammerer, Marion K., Jinesh, K. B., Rijks, Theo G. S. M., Roozeboom, Fred, Klootwijk, Johan H..
Characterization and modeling of atomic layer deposited high-density trench capacitors in silicon.
:
,
.
Text.
Gaya Turabian
Matters-Kammerer, Marion K., Jinesh, K. B., Rijks, Theo G. S. M., Roozeboom, Fred, Klootwijk, Johan H..
Characterization and modeling of atomic layer deposited high-density trench capacitors in silicon.
:
,
.
Print.