Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

Wafer map defect patterns provide valuable information for root cause analysis and yield learning. Previous studies show that supervised machine learning (ML) methods can achieve good defect patter…

Feature Boosting Network For 3D Pose Estimation

In this paper, a feature boosting network is proposed for estimating 3D hand pose and 3D body pose from a single RGB image. In this method, the features learned by the convolutional layers are boos…

TestDNA : Novel Wafer Defect Signature for Diagnosis and Pattern Recognition

The spatial failure patterns in wafer defect maps can be related to problems in the manufacturing and test process. Therefore, failure pattern recognition can be used for root cause analysis, which…

Crosstalk Noise Analysis and Optimization in 5x5 Hitless Silicon-Based Optica…

Afterpulsing effects in free-running InGaAsP single-photon avalanche diodes

Discovering the thematic object in commercial videos

A model reference robust control with application flight control system design

Satisfiability modulo graph theory for task mapping and scheduling on multipr…

changing role of land-use planning in the land-development process in Chinese…

Sparse and Dense Hybrid Representation via Dictionary Decomposition for Face …