Methodology for Important Sensor Screening for Fault Detection and Classifica…
Feature design and selection is challenging because of huge data volume and high-mix production systems. Most engineers still rely on human experts to suggest the specific sensor channel and specif…
Deep Learning-Based Domain Adaptation Method for Fault Diagnosis in Semicondu…
Quality inspection in semiconductor manufacturing is of great importance in the modern industries. In the recent years, intelligent data-driven condition monitoring methods have been successfully d…
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