One of the main issues of EUV lithography is Line Edge Roughness (LER) on photo-resists, which significantly impacts yield at sub-30 nm pitches. In this work, an analytical model of LER is presente…
A Brillouin phase spectra (BPS) demodulation approach in Brillouin optical time-domain analysis (BOTDA) based on phase to intensity conversion is proposed and demonstrated. By utilizing the cascade…
The sensors measuring torsion, refractive index, and temperature are demonstrated, based on an improved helical long-period fiber gratings (HLPFG), in which the refractive-index and torsion sensiti…
Frequency modulated continuous-wave (FMCW) radar systems suffer from permanent leakage from the transmitted signal into the receiver, which will reduce the dynamic range of the system and degrade t…