Gaya APA
Yap, Kuan Pei, Delage, Andre, Lapointe, Jean, Janz, Siegfried, Lamontagne, Boris, Schmid, Jens H, Waldron, Philip, Syrett, Barry A. ().
Correlation of scattering loss, sidewall roughness and waveguide width in silicon-on-insulator (SOI) ridge waveguides .
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Gaya Chicago
Yap, Kuan Pei, Delage, Andre, Lapointe, Jean, Janz, Siegfried, Lamontagne, Boris, Schmid, Jens H, Waldron, Philip, Syrett, Barry A.
Correlation of scattering loss, sidewall roughness and waveguide width in silicon-on-insulator (SOI) ridge waveguides.
:
,
.
Text.
Gaya MLA
Yap, Kuan Pei, Delage, Andre, Lapointe, Jean, Janz, Siegfried, Lamontagne, Boris, Schmid, Jens H, Waldron, Philip, Syrett, Barry A.
Correlation of scattering loss, sidewall roughness and waveguide width in silicon-on-insulator (SOI) ridge waveguides.
:
,
.
Text.
Gaya Turabian
Yap, Kuan Pei, Delage, Andre, Lapointe, Jean, Janz, Siegfried, Lamontagne, Boris, Schmid, Jens H, Waldron, Philip, Syrett, Barry A.
Correlation of scattering loss, sidewall roughness and waveguide width in silicon-on-insulator (SOI) ridge waveguides.
:
,
.
Print.