Gaya APA
Fujie, Zhou, Sheng, Hu, Xiaodi, Hu, Scullion, Tom, Mikhali, Magdy, Walubita, Lubinda. ().
Development, calibration, and verification of a new mechanistic-empirical reflective cracking model for HMA overlay thickness design and analysis .
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Gaya Chicago
Fujie, Zhou, Sheng, Hu, Xiaodi, Hu, Scullion, Tom, Mikhali, Magdy, Walubita, Lubinda.
Development, calibration, and verification of a new mechanistic-empirical reflective cracking model for HMA overlay thickness design and analysis.
:
,
.
Text.
Gaya MLA
Fujie, Zhou, Sheng, Hu, Xiaodi, Hu, Scullion, Tom, Mikhali, Magdy, Walubita, Lubinda.
Development, calibration, and verification of a new mechanistic-empirical reflective cracking model for HMA overlay thickness design and analysis.
:
,
.
Text.
Gaya Turabian
Fujie, Zhou, Sheng, Hu, Xiaodi, Hu, Scullion, Tom, Mikhali, Magdy, Walubita, Lubinda.
Development, calibration, and verification of a new mechanistic-empirical reflective cracking model for HMA overlay thickness design and analysis.
:
,
.
Print.