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Hongxia, Liu, Wen, Zhou, Qianwei, Kuang, Lei, Cao, Bo, Gao. ().
Defect detection of IC wafer based on spectral subtraction .
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Hongxia, Liu, Wen, Zhou, Qianwei, Kuang, Lei, Cao, Bo, Gao.
Defect detection of IC wafer based on spectral subtraction.
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Text.
Gaya MLA
Hongxia, Liu, Wen, Zhou, Qianwei, Kuang, Lei, Cao, Bo, Gao.
Defect detection of IC wafer based on spectral subtraction.
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.
Text.
Gaya Turabian
Hongxia, Liu, Wen, Zhou, Qianwei, Kuang, Lei, Cao, Bo, Gao.
Defect detection of IC wafer based on spectral subtraction.
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.
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