Gaya APA
Yili, Hong, Meeker, William Q. ().
Field-failure and warranty prediction based on auxiliary use-rate information .
:
.
Gaya Chicago
Yili, Hong, Meeker, William Q.
Field-failure and warranty prediction based on auxiliary use-rate information.
:
,
.
Text.
Gaya MLA
Yili, Hong, Meeker, William Q.
Field-failure and warranty prediction based on auxiliary use-rate information.
:
,
.
Text.
Gaya Turabian
Yili, Hong, Meeker, William Q.
Field-failure and warranty prediction based on auxiliary use-rate information.
:
,
.
Print.