Gaya APA
Haifeng, [Heidi] Xia, Yu, Ding, Mallick, Bani K. ().
Bayesian hierarchical model for combining misaligned two-resolution metrology data .
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Gaya Chicago
Haifeng, [Heidi] Xia, Yu, Ding, Mallick, Bani K.
Bayesian hierarchical model for combining misaligned two-resolution metrology data.
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.
Text.
Gaya MLA
Haifeng, [Heidi] Xia, Yu, Ding, Mallick, Bani K.
Bayesian hierarchical model for combining misaligned two-resolution metrology data.
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,
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Text.
Gaya Turabian
Haifeng, [Heidi] Xia, Yu, Ding, Mallick, Bani K.
Bayesian hierarchical model for combining misaligned two-resolution metrology data.
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,
.
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