Gaya APA
Krueger, Dana C, MONTGOMERY, Douglas C, Mastrangelo, Christina M. ().
Application of generalized linear models to predict semiconductor yield using defect metrology data .
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Gaya Chicago
Krueger, Dana C, MONTGOMERY, Douglas C, Mastrangelo, Christina M.
Application of generalized linear models to predict semiconductor yield using defect metrology data.
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Text.
Gaya MLA
Krueger, Dana C, MONTGOMERY, Douglas C, Mastrangelo, Christina M.
Application of generalized linear models to predict semiconductor yield using defect metrology data.
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Text.
Gaya Turabian
Krueger, Dana C, MONTGOMERY, Douglas C, Mastrangelo, Christina M.
Application of generalized linear models to predict semiconductor yield using defect metrology data.
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Print.