Gaya APA
Shuen-Lin, Jeng, Meeker, William Q., Bei-Ying, Huang. ().
Accelerated Destructive Degradation Test Robust to Distribution Misspecification .
:
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Gaya Chicago
Shuen-Lin, Jeng, Meeker, William Q., Bei-Ying, Huang.
Accelerated Destructive Degradation Test Robust to Distribution Misspecification.
:
,
.
Text.
Gaya MLA
Shuen-Lin, Jeng, Meeker, William Q., Bei-Ying, Huang.
Accelerated Destructive Degradation Test Robust to Distribution Misspecification.
:
,
.
Text.
Gaya Turabian
Shuen-Lin, Jeng, Meeker, William Q., Bei-Ying, Huang.
Accelerated Destructive Degradation Test Robust to Distribution Misspecification.
:
,
.
Print.