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Tao, Yuan, Suk, Joo Bae, Ramadan, Saleem Z.. (). Yield Predection for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects . : .

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Tao, Yuan, Suk, Joo Bae, Ramadan, Saleem Z.. Yield Predection for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects. : , . Text.

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Tao, Yuan, Suk, Joo Bae, Ramadan, Saleem Z.. Yield Predection for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects. : , . Text.

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Tao, Yuan, Suk, Joo Bae, Ramadan, Saleem Z.. Yield Predection for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects. : , . Print.