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Zhou, Zhe, Wen, Chenglin, Yang, Chunjie. (). Fault Detection Using Random Projections and k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes . : .

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Zhou, Zhe, Wen, Chenglin, Yang, Chunjie. Fault Detection Using Random Projections and k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes. : , . Text.

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Zhou, Zhe, Wen, Chenglin, Yang, Chunjie. Fault Detection Using Random Projections and k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes. : , . Text.

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Zhou, Zhe, Wen, Chenglin, Yang, Chunjie. Fault Detection Using Random Projections and k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes. : , . Print.