Gaya APA

Rahmawati, Endah, Budiman, Maman, Abdullah, Mikrajuddin, Ekawita, Riska, Khairurrijal. (). A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices . : .

Gaya Chicago

Rahmawati, Endah, Budiman, Maman, Abdullah, Mikrajuddin, Ekawita, Riska, Khairurrijal. A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices. : , . Text.

Gaya MLA

Rahmawati, Endah, Budiman, Maman, Abdullah, Mikrajuddin, Ekawita, Riska, Khairurrijal. A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices. : , . Text.

Gaya Turabian

Rahmawati, Endah, Budiman, Maman, Abdullah, Mikrajuddin, Ekawita, Riska, Khairurrijal. A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices. : , . Print.