Text

Characterization of Waveguide Photonic Crystal Reflectors on Indium Phosphide Membranes

We present waveguide photonic crystal reflectors on the InP-membrane-on-silicon (IMOS) platform, and a method to accurately measure the reflectivity of those reflectors. The photonic crystal holes are patterned on a waveguide using electron-beam lithography and etched through the waveguiding layer to create a broadband distributed Bragg reflector. We show simulations of these reflectors and experimental results of fabricated devices, both showing a high, free-to-choose reflectivity, and high quality factor Fabry-Pérot cavities. We experimentally show reflectivities higher than 95% for the reflectors and a quality factor as high as 15,911±511 for a Fabry-Pérot cavity, using reflectors with a length of only 4 microns. For the first time, to our knowledge, two methods for measuring the reflectivity are used for characterization of on-chip reflectors to accurately determine the reflection. The first method is based on analysis of the transmission through a Fabry-Pérot cavity, the second is based on a direct four-port measurement of the reflector. A systematic error is made in both methods, resulting in an upper and lower boundary for the actual reflection coefficient.

Ketersediaan

Informasi Detail

Judul Seri

IEEE JOURNAL OF QUANTUM ELECTRONICS; Vol.55 No.6 December 2019

No. Panggil

-

Penerbit

: .,

Deskripsi Fisik

p. 6400107

Bahasa

English

ISBN/ISSN

-

Klasifikasi

-

Tipe Isi

-

Tipe Media

-

Tipe Pembawa

-

Edisi

-

Subjek

PHOTONIC CRYSTALS
NANOPHOTONICS
PHOTONIC INTEGRATED CIRCUITS

Info Detail Spesifik

-

Pernyataan Tanggungjawab

Sander F. G. Reniers, Yi Wang, Kevin A. Williams, Jos J. G. M. Van Der Tol, Yuqing Jiao

Versi lain/terkait

Lampiran Berkas

Komentar