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Jang, Sung-Ju, Kim, Jong-Seong, Kim, Tae-Woo, Lee, Hyun-Jin, Ko, Seungbum. ().
A Wafer Map Yield Prediction Based on Machine Learning for Productivity Enhancement .
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Jang, Sung-Ju, Kim, Jong-Seong, Kim, Tae-Woo, Lee, Hyun-Jin, Ko, Seungbum.
A Wafer Map Yield Prediction Based on Machine Learning for Productivity Enhancement.
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Jang, Sung-Ju, Kim, Jong-Seong, Kim, Tae-Woo, Lee, Hyun-Jin, Ko, Seungbum.
A Wafer Map Yield Prediction Based on Machine Learning for Productivity Enhancement.
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.
Text.
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Jang, Sung-Ju, Kim, Jong-Seong, Kim, Tae-Woo, Lee, Hyun-Jin, Ko, Seungbum.
A Wafer Map Yield Prediction Based on Machine Learning for Productivity Enhancement.
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