Gaya APA

Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki. (). A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing . : .

Gaya Chicago

Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki. A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing. : , . Text.

Gaya MLA

Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki. A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing. : , . Text.

Gaya Turabian

Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki. A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing. : , . Print.