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Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki. ().
A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing .
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Gaya Chicago
Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki.
A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing.
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Text.
Gaya MLA
Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki.
A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing.
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,
.
Text.
Gaya Turabian
Imoto, Kazunori, Nakai, Tomohiro, Ike, Tsukasa, Haruki, Kosuke, Sato, Yoshiyuki.
A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing.
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