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Yu, Naigong, Wang, Honglu, Xu, Qiao. ().
Wafer Defect Pattern Recognition and Analysis Based on Convolutional Neural Network .
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Yu, Naigong, Wang, Honglu, Xu, Qiao.
Wafer Defect Pattern Recognition and Analysis Based on Convolutional Neural Network.
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Yu, Naigong, Wang, Honglu, Xu, Qiao.
Wafer Defect Pattern Recognition and Analysis Based on Convolutional Neural Network.
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Yu, Naigong, Wang, Honglu, Xu, Qiao.
Wafer Defect Pattern Recognition and Analysis Based on Convolutional Neural Network.
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