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Hu, Jianwei, Zhang, Jingfei, Zhu, Ji, Qin, Hong, Yan, Ting. ().
Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models .
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Hu, Jianwei, Zhang, Jingfei, Zhu, Ji, Qin, Hong, Yan, Ting.
Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models.
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Gaya MLA
Hu, Jianwei, Zhang, Jingfei, Zhu, Ji, Qin, Hong, Yan, Ting.
Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models.
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Text.
Gaya Turabian
Hu, Jianwei, Zhang, Jingfei, Zhu, Ji, Qin, Hong, Yan, Ting.
Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models.
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