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High-Performance InP-Based Bias-Tunable Near-Infrared/Extended-Short Wave Infrared Dual-Band Photodetectors
In this paper, a vertical stacked near-infrared (NIR) and extended short wavelength infrared (eSWIR) dual-band detector based on InGaAs and In 0.53 Ga 0.47 As/GaAs 0.5 Sb 0.5 type-II superlattice (T2SL) is presented. A barrier layer of AlAs 0.56 Sb 0.44 allows the independent working of the two sub-detectors. The InGaAs NIR sub-detector operates under positive bias, while the eSWIR band detector operates under reverse bias. The NIR sub-detector shows a dark current density of 7.35 × 10 −5 A/cm 2 under the bias of 0.1 V, the responsivity of 0.88 A/W, and a specific detectivity of 4.69 × 10 11 cm· Hz 1/2 /W at 1510 nm. Meanwhile, the dark current density of eSWIR sub-detector is 8.68 × 10 −4 A/cm 2 under −0.4 V with the corresponding responsivity of 0.21 A/W, and a specific detectivity of 1.85×10 10 cm·Hz 1/2 /W at 2 μm. Furthermore, a single-pixel imaging system is built to demonstrate the capability of dual-band detectors in information capturing and target recognition.
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