Gaya APA
Kahle, Waltraud, Collani, Elart von, Franz, Jurgen, Jensen, Uwe. (1998).
Advances in stochastic models for reliability, quality and safety .
Boston:
Birkhauser.
Gaya Chicago
Kahle, Waltraud, Collani, Elart von, Franz, Jurgen, Jensen, Uwe.
Advances in stochastic models for reliability, quality and safety.
Boston:
Birkhauser,
1998.
Text.
Gaya MLA
Kahle, Waltraud, Collani, Elart von, Franz, Jurgen, Jensen, Uwe.
Advances in stochastic models for reliability, quality and safety.
Boston:
Birkhauser,
1998.
Text.
Gaya Turabian
Kahle, Waltraud, Collani, Elart von, Franz, Jurgen, Jensen, Uwe.
Advances in stochastic models for reliability, quality and safety.
Boston:
Birkhauser,
1998.
Print.