Gaya APA
Yih-Yuh Doong, Kelvin. ().
Addressable failure site test structures (AFS-TS) for CMOS processes : design guidelines, fault simulation, and implementation .
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Gaya Chicago
Yih-Yuh Doong, Kelvin.
Addressable failure site test structures (AFS-TS) for CMOS processes : design guidelines, fault simulation, and implementation.
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Text.
Gaya MLA
Yih-Yuh Doong, Kelvin.
Addressable failure site test structures (AFS-TS) for CMOS processes : design guidelines, fault simulation, and implementation.
:
,
.
Text.
Gaya Turabian
Yih-Yuh Doong, Kelvin.
Addressable failure site test structures (AFS-TS) for CMOS processes : design guidelines, fault simulation, and implementation.
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