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Dynamic Down-Selection of Measurement Markers for Optimized Robust Control of…
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Zhang HuidongFeng, TianhengDjurdjanovic, Dragan

Control of overlay errors in lithography process in semiconductor manufacturing uses in-process measurements of overlay errors from markers distributed across a wafer to adapt controllable process …

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Robust Control of Overlay Erros in Photolithography Processes
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Djurdjanovic, DraganHaq, Asad Ul

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Joint allocation of measurement points and controllable tooling machines in m…
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Jiao, YiboDjurdjanovic, Dragan

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Growing Structure Multiple Model System for Quality Estimation in Manufacturi…
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Djurdjanovic, DraganBleakie, Alexander

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Stochastic Control of Multilayer Overlay in Lithography Processes
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Djurdjanovic, DraganYibo, Jiao

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Degradation Modeling and Monitoring of Machines Using Operation Specific Hidd…
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Djurdjanovic, DraganCholette, Michael E.

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Condition Monitoring and Operational Decision Making in Semiconductor Manufac…
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Djurdjanovic, DraganCholette, Michael E.Celen, MerveRasberry, John D.


Hasil Pencarian

Ditemukan 7 dari pencarian Anda melalui kata kunci: Pengarang : Djurdjanovic, Dragan
Permintaan membutuhkan 0,56779 detik untuk selesai
Saran
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Investor protection, income smoothing, and earnings informativeness
Cahan, Steven F - Guoping Liu - Sun, Jerry
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A Neuroevolution Approach to General Atari Game Playing
Stone, Peter - Hausknecht, Matthew - Lehman, Joel - Miikkulainen, Risto
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Managing operations : across the supply chain
COOPER, M. Bixby - Melnyk, Steven A. - Swink, Morgan - Hartley, Janet L.
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Penelaahan keandalan pengendalian intern siklus penggajian dan pengupahan untuk menentukan ruang lingkup pemeriksaan siklus penggajian dan pengupahan dalam laporan keuangan : studi kasus PT. CLP di Bandung
Manurung, Elizabeth Tiur - Basah, Ermila Ali
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A Stochastic Composite Augmented Lagrangian Method for Reinforcement Learning
Li, Yongfeng - Wen, Zaiwen - Zhao, Mingming - Chen, Weijie