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An On-Chip Micromachined Test Structure to Study the Tribological Behavior of…
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Mita, YoshioOkamoto, YukiReddy, R. Ranga

An on-chip micro-mechanical test structure is presented to investigate the tribological behavior of deep reactive ion etching (DRIE) sidewall surfaces of microelectromechanical systems (MEMS) devic…

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Test Structures for End-Point Visualization of All-Plasma Dry Release of Deep…
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Okamoto, YukiLebrasseur, EricMori, IsaoMarty, FredericMita, Yoshio

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Improved Bounds for Wireless Localizaion
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Christ, TobiasHoffmann, MichaelOkamoto, YoshioUni, Takeaki


Hasil Pencarian

Ditemukan 3 dari pencarian Anda melalui kata kunci: Pengarang : Okamoto, Yoshio
Permintaan membutuhkan 0,56859 detik untuk selesai
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