In this paper, we demonstrate up to 260-GBaud single-wavelength coherent transmission by employing an optical transmitter based on two wide-bandwidth devices: a novel 260-GS/s arbitrary waveform ge…
Wafer map defect patterns provide valuable information for root cause analysis and yield learning. Previous studies show that supervised machine learning (ML) methods can achieve good defect patter…
Spatial failure patterns in wafer defect maps are very useful for root cause analysis, which is essential for yield optimization in the manufacturing process. Especially, the scratch defect type is…
This article reports the application of an equalizer based on an artificial neural network (ANN), in the form of nonlinear waveform regression, to mitigate nonlinear impairments in directly modulat…
Wafer test is carried out after integrated circuits (IC) fabrication to screen out bad dies. In addition, the results can be used to identify problems in the fabrication process and improve manufac…
Wafer map defect pattern recognition provides useful clues to yield learning. However, most wafer maps have no special spatial patterns and are full of noises, which make pattern recognition diffic…
The spatial failure patterns in wafer defect maps can be related to problems in the manufacturing and test process. Therefore, failure pattern recognition can be used for root cause analysis, which…